Double Pulse Testing, Three Ways: From Manual Bench to Automated Production Cell at PCIM
The double pulse test is the same. The infrastructure around it has split into three distinct product categories: precision bench characterization (R&S MXO5), automated production testing (iPE cell), and development...
WeiterlesenNo Bulk Capacitor, No Problem: Inside TI's Single-Stage Micro Inverter Demo at PCIM
A single-stage AC/DC micro inverter eliminates the intermediate 400V bus capacitors that limit the service life of conventional two-stage designs. The TI TIDM-01035ME2 at PCIM showed what that looks like...
WeiterlesenTwo Oscilloscopes, One Wolfspeed Board: How Keysight Tackles the High-Side Measurement Problem at PCIM
One Wolfspeed SiC evaluation board. Two Keysight oscilloscopes — 1 GHz 14-bit on the left, 6 GHz 16-bit on the right. Same DUT, different measurement questions, different instrument tiers. The...
WeiterlesenThe World's Only Fibre Optic Isolated Oscilloscope: Why Cleverscope CS548 Exists and What It Solves
How do you measure the high-side gate voltage in a GaN inverter when the switching node swings at 100 V/ns? The Cleverscope CS548 uses fibre optic isolation — 2kV between...
WeiterlesenAdaptive Gate Current Shaping: How Bosch EG120 Solves the Parallel SiC-MOSFET Balancing Problem
Two SiC MOSFETs in parallel will never have exactly the same threshold voltage. That nanosecond difference creates transient current imbalance that degrades reliability over a vehicle's lifetime. The Bosch EG120...
WeiterlesenMeasuring the Invisible: Isotropic EMF Measurement Up to 8 GHz and What WiFi 6E Changed
WiFi 6E opened the 6 GHz band. Most existing isotropic EMF measurement systems stopped just below it. The R&S TS-EMF with the new TSEMF-B2E antenna extends coverage to 8 GHz...
WeiterlesenLISN + EMI Receiver + a Light Bulb: The Conducted Emissions Test That Every Product Needs
Three things: a LISN, a light bulb, and an EMI receiver measuring from 9 kHz to 30 MHz. This is the conducted emissions test that every electrical product sold in...
WeiterlesenEMC & REGULATORY TESTING OF DUT WITH RADIO FUNCTIONALITY
An AVM FRITZ!Box WiFi router as the device under test. An instrument rack worth six figures keeping its radio link alive while the EMC measurement runs. The R&S TS8996 solves...
WeiterlesenTesting Automotive Radar in an EMC Storm: What Happens When 77 GHz Meets Interference
A speedometer showing radar-detected velocity — in real time, under active EMC interference. The R&S automotive radar testing demo at Cologne closed the gap between functional radar validation and EMC...
WeiterlesenCompliance Testing Up to 44 GHz — And a Robot to Run It
A yellow robot arm positioning antennas in a miniature semi-anechoic chamber. Two ESW EMI receivers running in parallel to 44 GHz. 510 MHz FFT bandwidth for gapless CISPR band coverage....
WeiterlesenDifferential Mode vs Common Mode: Why Splitting EMI at the Source Changes Everything
Differential mode and common mode EMI require different filters, different measurements, and different debug strategies. The R&S RTO G + ZES Zimmer LMG671 joint booth at Cologne showed what it...
WeiterlesenThe Microwave Oven on the Test Bench: What 225 MHz Real-Time Bandwidth Is Actually For
A microwave oven generates multi-decade, multi-mechanism EMI — from TRIAC switching harmonics at 150 kHz through magnetron broadband emission at 2.45 GHz and beyond. The TDEMI G Series at 225...
WeiterlesenSynchronized, Automated, Multi-Band: The Keysight Approach to EMC and Wireless Coexistence Testing
869 MHz and 2.4 GHz monitored simultaneously, time-synchronized, with 100% probability of intercept and automated test sequencing. The Keysight multi-instrument coexistence demo at Cologne explained what it takes to validate...
WeiterlesenDC to 40 GHz in Real Time: What the TDEMI ULTRA Is Actually Claiming
A table lamp as the device under test. A spectrum from DC to 40 GHz captured in real time. The Gauss Instruments TDEMI ULTRA Series isn't modest about what it...
Weiterlesen1000 MHz Real-Time: When EMI Measurement Becomes a 3D Map of Electromagnetic Space
A 3D spectrogram shaped like a blue tornado: frequency vs rotation angle vs amplitude, captured simultaneously across 1000 MHz in a single turntable pass. The Gauss Instruments TDEMI Ultimate redefines...
Weiterlesen510 MHz Real-Time: How IQ Capture Changes the Logic of EMI Measurement
Traditional EMI testing produces a result. Real-time IQ capture produces a dataset. The Gauss Instruments TDEMI S — 510 MHz capture bandwidth, density display, full replay — explains what that...
WeiterlesenBode Plot as a Design Tool: How Filter Characterization Predicts EMC Compliance
One curve, three frequency regions, one answer: does your EMI filter work — and where does it stop working? A breakdown of the Omicron Lab Bode 500 demo from a...
WeiterlesenWhen an Oscilloscope Becomes a Motor Drive Analyzer: The Case for Application-Specific Measurement
The MDA 8208HD doesn't call itself an oscilloscope. It's a Motor Drive Analyzer — and that distinction defines everything: 8 channels for three-phase systems, automated harmonic analysis, and correlated time-frequency...
WeiterlesenOne Signal, Four Perspectives: What a 12-Bit Oscilloscope Actually Shows You
The same signal, four analytical perspectives at once. The Teledyne LeCroy WavePro 804HD-MS 12-bit demo in Turin showed what it means to move from waveform observation to behavioral characterization.
Weiterlesen12-Bit Oscilloscopes: When More Resolution Reveals More — and Demands More
12-bit resolution gives you 16× more vertical detail than standard 8-bit. But it also amplifies everything your probe introduces. A breakdown of the Yokogawa DLM5058HD demo
WeiterlesenWhen a Spectrum Analyzer Becomes a Surveillance System
At 26.5 GHz with GPS-synchronized direction finding, the FieldFox N9918D is no longer just a handheld analyzer. It's a node in a distributed RF sensing network. Here's what that means...
WeiterlesenWhy Measuring GaN Switching Is Harder Than Designing It
At high dv/dt and di/dt, measuring GaN switching behavior becomes more challenging than designing it. This article breaks down a complete probe-based measurement system observed at Embedded World 2026.
WeiterlesenSignal Integrity Design Validation: Why PCB Structures Must Be Measured, Not Assumed
At GHz speeds, PCB traces are no longer passive wires — they define signal behavior. Here's how vector network analysis makes that visible, measurable, and fixable.
WeiterlesenWhy Products Fail EMI: A Pre-Compliance Testing Guide for Engineers
Pre-compliance EMI testing helps engineers detect emission issues early, reducing certification risks and costly redesigns in modern electronic systems.
WeiterlesenWhy Your Signal Problem Is Actually a Power Problem: The Physics Behind SI/PI Coupling
Power noise does not stay in the power domain. It becomes timing uncertainty, which becomes bit errors. At Embedded World 2026, I watched Tektronix demonstrate why signal integrity and power...
WeiterlesenDe-embedding in High-Speed Signal Integrity: Reconstructing the True Signal Beyond the Measurement Channel
At Embedded World 2026, Tektronix presented something that did not look like a traditional oscilloscope demo. There was no waveform on a large screen, no eye diagram being explained to...
WeiterlesenOne Oscilloscope. Four Domains. Why Modern Automotive Debugging Is a System Problem
At Embedded World 2026, one Tektronix demo captured why modern automotive debugging spans four domains: CAN bus, RF/wireless, EMI, and signal integrity — all from a single oscilloscope platform.
WeiterlesenHigh-Speed Interface Testing for DDR and USB: When Digital Signals Become Analog
At DDR5 speeds, one bit lasts 156 picoseconds. At this scale, there is no digital — only analog behavior. At Embedded World 2026, I watched what it takes to keep...
WeiterlesenBattery Emulation vs Battery Testing: Why the Best Labs No Longer Use Real Batteries
At Embedded World 2026, one trend stood out clearly: engineers are replacing real batteries with programmable emulation systems. Here is why — and what the complete test setup actually looks...
Weiterlesen1000BASE-T Ethernet Compliance Testing: What IEEE 802.3 Actually Demands from Your Hardware
Live from Embedded World 2026: how IEEE 802.3 compliance testing works — PAM-5 mask testing, test fixture setup, and ScopeSuite automation explained.
WeiterlesenAutomotive Ethernet Is Entering the Most Critical Phase of Its Adoption — And Most Engineers Are Not Ready
At Embedded World 2026, I watched a live Automotive Ethernet eye diagram close in real time. Here's what that means for every team building ADAS and SDV systems — and...
WeiterlesenHigh-Speed Interconnect Testing: Why Signal Integrity Is Critical for Modern AI and Data Systems
At high data rates, interconnects are no longer passive connections.PCB traces, connectors, and cables behave as complex analog systems.Signal integrity is becoming a critical factor in modern AI and high-speed...
WeiterlesenWhy Modern Debugging Requires Both Protocol and Physical Layer Analysis?
Most debugging tools show only part of the story.Oscilloscopes reveal signals.Protocol analyzers decode data.But real problems often exist between the two.
WeiterlesenKelvin Measurement Explained: Why 4-Wire Sensing Is Essential for Milliohm and Micro-Ohm Precision
Measuring milliohm resistance is not as simple as applying Ohm’s law. At this level, lead resistance and contact effects dominate the result. Kelvin (4-wire) measurement eliminates these errors and enables...
WeiterlesenIsolated Oscilloscopes: Why They Are Critical for Power Electronics Measurement
Modern power electronics systems challenge traditional oscilloscope design. Shared-ground measurements introduce errors and risks in high-voltage environments. Isolated architectures provide a fundamentally different approach to accurate measurement.
WeiterlesenEMV 2026: The Shift from EMI Receivers to Measurement Architectures
EMV 2026 in Cologne once again confirmed its position as one of the most important events in the electromagnetic compatibility (EMC) field. Beyond product launches and live demonstrations, this year...
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