Rohde & Schwarz Wideband Modulated Load Pull: The Test That Deliberately Breaks Your Amplifier
Load pull testing deliberately varies impedance away from the ideal operating point — until the amplifier's behavior is fully mapped. At the microwave show, R&S showed why wideband modulated load...
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Rohde & Schwarz ZNA at 67 GHz: When 16 Traces Tell You Everything — Except What You Need to Know
Sixteen traces. Four Smith charts. Full S-parameter matrix from 10 MHz to 67 GHz. The R&S ZNA screen at the microwave show looked like everything you'd need. Here's what it...
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MACOM and NI at the Microwave Show: From 250W GaN to 140 GHz SDR — What a "Complete System" Actually Looks Like
Two booths, 40 meters apart. MACOM with 250W GaN and 60 dBm limiters. NI with a live 140 GHz SDR link across 40 cm of free space. Neither was showing...
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Keysight Sub-THz Device Analysis at 307 GHz: How University of Stuttgart Is Building 6G IC Test Infrastructure
Center frequency: 307 GHz. Modulation bandwidth: 40 GHz. Residual EVM target: less than 1%. At the microwave show in the Netherlands, Keysight's Sub-THz Device Analysis bench — built with VDI...
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Keysight UXA + VDI WR 6.5 at 140 GHz: What a 16-QAM Constellation Actually Tells You
The center frequency read 140.171752297 GHz. 16-QAM. 500 MHz symbol rate. 2 Gbps raw data rate. At the microwave show in the Netherlands, Keysight's UXA and a VDI WR 6.5...
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Aaronia AG at a Microwave Show: 3 THz/s Sweep Speed — World Record via USB, and What That Actually Means
"World Record Sweep Speed via USB." That's what the red banner said on Aaronia's curved multi-panel display. 3 THz/s. 490 MHz RTBW. 40 FPS. Here's what those numbers mean in...
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Keysight FieldFox at a Microwave Show: From 14 GHz Pulse Sequences to 94 GHz mmWave — What "Field Test" Actually Means
Two FieldFox analyzers, one table. One running 14 GHz pulse sequences for radar timing. The other capturing 94 GHz spectrum with a VDI mmWave extender and gold horn antenna. A...
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Power Integrity at PCIM: What OMICRON Lab and Picotest Were Really Asking
"Is your test bench complete?" That was the question on the wall at the OMICRON Lab and Picotest booth at PCIM. Four live demos — loop gain, output impedance, PSRR,...
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Tektronix vs. Keysight at PCIM: Two Ways to Look Inside a SiC MOSFET
Two booths at PCIM. Two oscilloscope giants. Both measuring SiC MOSFETs — but asking entirely different questions. This is what the Tektronix/Keithley vs. Keysight split reveals about where SiC technology...
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Wolfspeed Gen 4 SiC MOSFET at PCIM: 30–50% Less Turn-On Loss — But What Are You Actually Measuring?
Gen 4 delivers 30–50% lower turn-on switching losses. That's the claim. At PCIM, Wolfspeed backed it with a live oscilloscope comparison — three devices, same loop, same conditions. Here's what...
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SiC MOSFET Power Characterization at PCIM: Why Static and Dynamic Are Two Different Worlds
Two stations. Two measurement worlds. Tektronix and Keithley showed at PCIM why static DC characterization and dynamic switching power testing are not the same thing — and why SiC MOSFET...
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Double Pulse Testing, Three Ways: From Manual Bench to Automated Production Cell at PCIM
The double pulse test is the same. The infrastructure around it has split into three distinct product categories: precision bench characterization (R&S MXO5), automated production testing (iPE cell), and development...
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