Tektronix vs. Keysight at PCIM: Two Ways to Look Inside a SiC MOSFET
Two booths at PCIM. Two oscilloscope giants. Both measuring SiC MOSFETs — but asking entirely different questions. This is what the Tektronix/Keithley vs. Keysight split reveals about where SiC technology...
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SiC MOSFET Power Characterization at PCIM: Why Static and Dynamic Are Two Different Worlds
Two stations. Two measurement worlds. Tektronix and Keithley showed at PCIM why static DC characterization and dynamic switching power testing are not the same thing — and why SiC MOSFET...
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Why Your Signal Problem Is Actually a Power Problem: The Physics Behind SI/PI Coupling
Power noise does not stay in the power domain. It becomes timing uncertainty, which becomes bit errors. At Embedded World 2026, I watched Tektronix demonstrate why signal integrity and power...
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De-embedding in High-Speed Signal Integrity: Reconstructing the True Signal Beyond the Measurement Channel
At Embedded World 2026, Tektronix presented something that did not look like a traditional oscilloscope demo. There was no waveform on a large screen, no eye diagram being explained to...
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