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1000 MHz Real-Time: When EMI Measurement Becomes a 3D Map of Electromagnetic Space
A 3D spectrogram shaped like a blue tornado: frequency vs rotation angle vs amplitude, captured simultaneously across 1000 MHz in a single turntable pass. The Gauss Instruments TDEMI Ultimate redefines...
- Anritsu
- Conversion Phase
- EuMW 2026
- Field Notes
- Frequency Conversion
- Group Delay
- Mixer Measurement
- Signal Intelligence
- Tensor VNA
- Vector Mixer Calibration
Conversion Phase Needs an LO Reference: Reading a Vector Mixer Measurement at EuMW 2026
At EuMW 2026, Anritsu showed scalar and vector mixer measurements on its four-port Tensor VNA. On the demo screen, a consistent phase slope gave about 3.6 ns of group delay,...
De-embedding in High-Speed Signal Integrity: Reconstructing the True Signal Beyond the Measurement Channel
At Embedded World 2026, Tektronix presented something that did not look like a traditional oscilloscope demo. There was no waveform on a large screen, no eye diagram being explained to...
- Anritsu
- Bi-directional Coupler
- EuMW 2026
- Field Notes
- Peak Power Sensor
- Pulsed RF
- RF Power Measurement
- Signal Intelligence
One Pulse, Three Sensors: What a Synchronised Power Measurement Reveals About an Amplifier’s Tail
At EuMW 2026, Anritsu showed a bi-directionalcoupler with three synchronised peak power sensors on a pulsedamplifier. The ratio between the channels held at 19.741 dB while theabsolute values drifted. The...
- CISPR
- ConductedEmissions
- EMC
- EMI
- GaussInstruments
- IQAnalysis
- RealTimeMeasurement
- SignalIntelligence
- SpectrumAnalyzer
510 MHz Real-Time: How IQ Capture Changes the Logic of EMI Measurement
Traditional EMI testing produces a result. Real-time IQ capture produces a dataset. The Gauss Instruments TDEMI S — 510 MHz capture bandwidth, density display, full replay — explains what that...
Why Measuring GaN Switching Is Harder Than Designing It
At high dv/dt and di/dt, measuring GaN switching behavior becomes more challenging than designing it. This article breaks down a complete probe-based measurement system observed at Embedded World 2026.
Kelvin Measurement Explained: Why 4-Wire Sensing Is Essential for Milliohm and Micro-Ohm Precision
Measuring milliohm resistance is not as simple as applying Ohm’s law. At this level, lead resistance and contact effects dominate the result. Kelvin (4-wire) measurement eliminates these errors and enables...
Virginia Diodes Compact W-Band VNA Extender + MilliBox at EuMW 2025: When Geometry Becomes Part of the Measurement
A compact Keysight P5006B VNA. Two VDI WR10+ extenders covering 67–115 GHz. A MilliBox GIM04 300E multi-axis robotic arm sweeping a W-band module through angular positions. At EuMW 2025, this...
- Bosch EG120
- Gate Driver
- Gate Shaping
- Oscilloscope
- Parallel Switching
- PCIM 2025
- Power Electronics
- SiC MOSFET
- Tektronix DPO4034B
Smart Switching in SiC: How Bosch’s EG120 Gate Driver Uses Oscilloscope Feedback to Synchronize Power Devices
This hands-on demo from Bosch shows how adaptive gate current shaping and real-time oscilloscope feedback can solve one of the biggest challenges in parallel SiC MOSFET switching.
- Embedded World 2026
- High Speed PCB
- Insertion Loss
- PCB Design Validation
- S-Parameters
- Signal Integrity
- Transmission Line
- VNA
Signal Integrity Design Validation: Why PCB Structures Must Be Measured, Not Assumed
At GHz speeds, PCB traces are no longer passive wires — they define signal behavior. Here's how vector network analysis makes that visible, measurable, and fixable.
Wolfspeed Gen 4 SiC MOSFET at PCIM: 30–50% Less Turn-On Loss — But What Are You Actually Measuring?
Gen 4 delivers 30–50% lower turn-on switching losses. That's the claim. At PCIM, Wolfspeed backed it with a live oscilloscope comparison — three devices, same loop, same conditions. Here's what...
Differential Mode vs Common Mode: Why Splitting EMI at the Source Changes Everything
Differential mode and common mode EMI require different filters, different measurements, and different debug strategies. The R&S RTO G + ZES Zimmer LMG671 joint booth at Cologne showed what it...
Tektronix vs. Keysight at PCIM: Two Ways to Look Inside a SiC MOSFET
Two booths at PCIM. Two oscilloscope giants. Both measuring SiC MOSFETs — but asking entirely different questions. This is what the Tektronix/Keithley vs. Keysight split reveals about where SiC technology...
Power Integrity at PCIM: What OMICRON Lab and Picotest Were Really Asking
"Is your test bench complete?" That was the question on the wall at the OMICRON Lab and Picotest booth at PCIM. Four live demos — loop gain, output impedance, PSRR,...
- 1000BASE-T
- CISPR Standard
- Electronic Certification
- Embedded World
- EMC Measurement
- EMI Receiver
- EMI TestingPre-Compliance
- FCC Compliance
- Pre-Compliance
- Radiated Emission
- spectrum analysis
Why Products Fail EMI: A Pre-Compliance Testing Guide for Engineers
Pre-compliance EMI testing helps engineers detect emission issues early, reducing certification risks and costly redesigns in modern electronic systems.
- ApplianceTesting
- CISPR
- ComplianceTesting
- EMC
- EMI
- GaussInstruments
- RealTimeMeasurement
- SpectrumAnalyzer
- TDEMI
The Microwave Oven on the Test Bench: What 225 MHz Real-Time Bandwidth Is Actually For
A microwave oven generates multi-decade, multi-mechanism EMI — from TRIAC switching harmonics at 150 kHz through magnetron broadband emission at 2.45 GHz and beyond. The TDEMI G Series at 225...