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SiC MOSFET Power Characterization at PCIM: Why Static and Dynamic Are Two Different Worlds

SiC MOSFET Power Characterization at PCIM: Why Static and Dynamic Are Two Different Worlds

Two stations. Two measurement worlds. Tektronix and Keithley showed at PCIM why static DC characterization and dynamic switching power testing are not the same thing — and why SiC MOSFET...

Apr 30, 2026Brownkeys SignalByThomas
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Tektronix vs. Keysight at PCIM: Two Ways to Look Inside a SiC MOSFET

Tektronix vs. Keysight at PCIM: Two Ways to Look Inside a SiC MOSFET

Two booths at PCIM. Two oscilloscope giants. Both measuring SiC MOSFETs — but asking entirely different questions. This is what the Tektronix/Keithley vs. Keysight split reveals about where SiC technology...

May 1, 2026Brownkeys SignalByThomas
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MACOM and NI at the Microwave Show: From 250W GaN to 140 GHz SDR — What a "Complete System" Actually Looks Like

MACOM and NI at the Microwave Show: From 250W GaN to 140 GHz SDR — What a "Complete System" Actually Looks Like

Two booths, 40 meters apart. MACOM with 250W GaN and 60 dBm limiters. NI with a live 140 GHz SDR link across 40 cm of free space. Neither was showing...

May 6, 2026Brownkeys SignalByThomas
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