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SiC MOSFET Power Characterization at PCIM: Why Static and Dynamic Are Two Different Worlds
Two stations. Two measurement worlds. Tektronix and Keithley showed at PCIM why static DC characterization and dynamic switching power testing are not the same thing — and why SiC MOSFET...
Tektronix vs. Keysight at PCIM: Two Ways to Look Inside a SiC MOSFET
Two booths at PCIM. Two oscilloscope giants. Both measuring SiC MOSFETs — but asking entirely different questions. This is what the Tektronix/Keithley vs. Keysight split reveals about where SiC technology...
- AutomotivePower
- Bosch
- EVPowerTrain
- GateDriver
- PCIM2025
- PowerElectronics
- SiC
- SignalIntegrity
- TractionInverter
Adaptive Gate Current Shaping: How Bosch EG120 Solves the Parallel SiC-MOSFET Balancing Problem
Two SiC MOSFETs in parallel will never have exactly the same threshold voltage. That nanosecond difference creates transient current imbalance that degrades reliability over a vehicle's lifetime. The Bosch EG120...
- Bosch EG120
- Gate Driver
- Gate Shaping
- Oscilloscope
- Parallel Switching
- PCIM 2025
- Power Electronics
- SiC MOSFET
- Tektronix DPO4034B
Smart Switching in SiC: How Bosch’s EG120 Gate Driver Uses Oscilloscope Feedback to Synchronize Power Devices
This hands-on demo from Bosch shows how adaptive gate current shaping and real-time oscilloscope feedback can solve one of the biggest challenges in parallel SiC MOSFET switching.
Wolfspeed Gen 4 SiC MOSFET at PCIM: 30–50% Less Turn-On Loss — But What Are You Actually Measuring?
Gen 4 delivers 30–50% lower turn-on switching losses. That's the claim. At PCIM, Wolfspeed backed it with a live oscilloscope comparison — three devices, same loop, same conditions. Here's what...
- AutomatedTesting
- DoublePulseTest
- GateDriver
- Oscilloscope
- PCIM2025
- PowerElectronics
- RohdeSchwarz
- SiC
- Wolfspeed
Double Pulse Testing, Three Ways: From Manual Bench to Automated Production Cell at PCIM
The double pulse test is the same. The infrastructure around it has split into three distinct product categories: precision bench characterization (R&S MXO5), automated production testing (iPE cell), and development...
- DesignValidation
- GaN
- HighSideMeasurement
- Keysight
- Oscilloscope
- PCIM2025
- PowerElectronics
- SiC
- SignalIntegrity
Two Oscilloscopes, One Wolfspeed Board: How Keysight Tackles the High-Side Measurement Problem at PCIM
One Wolfspeed SiC evaluation board. Two Keysight oscilloscopes — 1 GHz 14-bit on the left, 6 GHz 16-bit on the right. Same DUT, different measurement questions, different instrument tiers. The...
- Embedded World 2026
- High Voltage Measurement
- Motor Drive Testing
- Oscilloscope
- Power Electronics
- Signal Integrity
Isolated Oscilloscopes: Why They Are Critical for Power Electronics Measurement
Modern power electronics systems challenge traditional oscilloscope design. Shared-ground measurements introduce errors and risks in high-voltage environments. Isolated architectures provide a fundamentally different approach to accurate measurement.
- DoublePulseTest
- GaN
- GateDriver
- HighSideMeasurement
- IsolatedOscilloscope
- PCIM2025
- PowerElectronics
- SiC
- SignalIntegrity
The World's Only Fibre Optic Isolated Oscilloscope: Why Cleverscope CS548 Exists and What It Solves
How do you measure the high-side gate voltage in a GaN inverter when the switching node swings at 100 V/ns? The Cleverscope CS548 uses fibre optic isolation — 2kV between...
Why Measuring GaN Switching Is Harder Than Designing It
At high dv/dt and di/dt, measuring GaN switching behavior becomes more challenging than designing it. This article breaks down a complete probe-based measurement system observed at Embedded World 2026.
What Are You Missing with an 8-Bit Oscilloscope? A Closer Look at the UNI-T MSO5000HD
More bits alone do not make a better oscilloscope. What matters is whether higher resolution, low noise, deep memory and fast acquisition help you see something your existing instrument may...
MACOM and NI at the Microwave Show: From 250W GaN to 140 GHz SDR — What a "Complete System" Actually Looks Like
Two booths, 40 meters apart. MACOM with 250W GaN and 60 dBm limiters. NI with a live 140 GHz SDR link across 40 cm of free space. Neither was showing...
EMC & REGULATORY TESTING OF DUT WITH RADIO FUNCTIONALITY
An AVM FRITZ!Box WiFi router as the device under test. An instrument rack worth six figures keeping its radio link alive while the EMC measurement runs. The R&S TS8996 solves...
Introducing the UNI-T UDP4303S: Redefining Programmable Power Supply Innovation
When performance meets precision, the result is something truly extraordinary—UNI-T’s latest programmable linear DC power supply: the UDP4303S. Built for engineers, labs, R&D departments, and serious electronics professionals, this 4-channel...
- Aaronia
- EMC testing
- Ham Radio
- real-time RF
- RF monitoring
- RTSA-Suite
- spectrum analysis
- spectrum intelligence
World’s Fastest Real-Time Spectrum Analysis? Aaronia’s RF Beast at Ham Radio 2025
A deep dive into Aaronia’s triple-screen RTSA demo at Ham Radio 2025 — showcasing 3.2 THz/s sweep speed, AI signal classification, and field-ready spectrum analysis.
- FPC1500
- ISM band
- lab equipment
- NGE100B
- power supply
- RF demo
- RF education
- RF testing
- Rohde & Schwarz
- spectrum analyzer
Affordable RF Testing for Labs and Students: R&S FPC1500 + NGE103B Powering a Multi-Channel Demo
This hands-on RF test bench demo combines the compact R&S FPC1500 spectrum analyzer and NGE103B power supply to measure, power, and monitor a multi-channel RF module — all in one...