Keysight Sub-THz Device Analysis at 307 GHz: How University of Stuttgart Is Building 6G IC Test Infrastructure
Center frequency: 307 GHz. Modulation bandwidth: 40 GHz. Residual EVM target: less than 1%. At the microwave show in the Netherlands, Keysight's Sub-THz Device Analysis bench — built with VDI...
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Keysight UXA + VDI WR 6.5 at 140 GHz: What a 16-QAM Constellation Actually Tells You
The center frequency read 140.171752297 GHz. 16-QAM. 500 MHz symbol rate. 2 Gbps raw data rate. At the microwave show in the Netherlands, Keysight's UXA and a VDI WR 6.5...
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Aaronia AG at a Microwave Show: 3 THz/s Sweep Speed — World Record via USB, and What That Actually Means
"World Record Sweep Speed via USB." That's what the red banner said on Aaronia's curved multi-panel display. 3 THz/s. 490 MHz RTBW. 40 FPS. Here's what those numbers mean in...
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Keysight FieldFox at a Microwave Show: From 14 GHz Pulse Sequences to 94 GHz mmWave — What "Field Test" Actually Means
Two FieldFox analyzers, one table. One running 14 GHz pulse sequences for radar timing. The other capturing 94 GHz spectrum with a VDI mmWave extender and gold horn antenna. A...
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Power Integrity at PCIM: What OMICRON Lab and Picotest Were Really Asking
"Is your test bench complete?" That was the question on the wall at the OMICRON Lab and Picotest booth at PCIM. Four live demos — loop gain, output impedance, PSRR,...
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Tektronix vs. Keysight at PCIM: Two Ways to Look Inside a SiC MOSFET
Two booths at PCIM. Two oscilloscope giants. Both measuring SiC MOSFETs — but asking entirely different questions. This is what the Tektronix/Keithley vs. Keysight split reveals about where SiC technology...
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Wolfspeed Gen 4 SiC MOSFET at PCIM: 30–50% Less Turn-On Loss — But What Are You Actually Measuring?
Gen 4 delivers 30–50% lower turn-on switching losses. That's the claim. At PCIM, Wolfspeed backed it with a live oscilloscope comparison — three devices, same loop, same conditions. Here's what...
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SiC MOSFET Power Characterization at PCIM: Why Static and Dynamic Are Two Different Worlds
Two stations. Two measurement worlds. Tektronix and Keithley showed at PCIM why static DC characterization and dynamic switching power testing are not the same thing — and why SiC MOSFET...
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Double Pulse Testing, Three Ways: From Manual Bench to Automated Production Cell at PCIM
The double pulse test is the same. The infrastructure around it has split into three distinct product categories: precision bench characterization (R&S MXO5), automated production testing (iPE cell), and development...
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No Bulk Capacitor, No Problem: Inside TI's Single-Stage Micro Inverter Demo at PCIM
A single-stage AC/DC micro inverter eliminates the intermediate 400V bus capacitors that limit the service life of conventional two-stage designs. The TI TIDM-01035ME2 at PCIM showed what that looks like...
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Two Oscilloscopes, One Wolfspeed Board: How Keysight Tackles the High-Side Measurement Problem at PCIM
One Wolfspeed SiC evaluation board. Two Keysight oscilloscopes — 1 GHz 14-bit on the left, 6 GHz 16-bit on the right. Same DUT, different measurement questions, different instrument tiers. The...
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The World's Only Fibre Optic Isolated Oscilloscope: Why Cleverscope CS548 Exists and What It Solves
How do you measure the high-side gate voltage in a GaN inverter when the switching node swings at 100 V/ns? The Cleverscope CS548 uses fibre optic isolation — 2kV between...
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