Suchergebnisse

LISN + EMI Receiver + a Light Bulb: The Conducted Emissions Test That Every Product Needs

LISN + EMI Receiver + a Light Bulb: The Conducted Emissions Test That Every Product Needs

Three things: a LISN, a light bulb, and an EMI receiver measuring from 9 kHz to 30 MHz. This is the conducted emissions test that every electrical product sold in...

26. Apr 2026Brownkeys SignalByThomas
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Double Pulse Testing, Three Ways: From Manual Bench to Automated Production Cell at PCIM

Double Pulse Testing, Three Ways: From Manual Bench to Automated Production Cell at PCIM

The double pulse test is the same. The infrastructure around it has split into three distinct product categories: precision bench characterization (R&S MXO5), automated production testing (iPE cell), and development...

29. Apr 2026Brownkeys SignalByThomas
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1000BASE-T Ethernet Compliance Testing: What IEEE 802.3 Actually Demands from Your Hardware

1000BASE-T Ethernet Compliance Testing: What IEEE 802.3 Actually Demands from Your Hardware

Live from Embedded World 2026: how IEEE 802.3 compliance testing works — PAM-5 mask testing, test fixture setup, and ScopeSuite automation explained.

15. Apr 2026Brown keys
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Compliance Testing Up to 44 GHz — And a Robot to Run It

Compliance Testing Up to 44 GHz — And a Robot to Run It

A yellow robot arm positioning antennas in a miniature semi-anechoic chamber. Two ESW EMI receivers running in parallel to 44 GHz. 510 MHz FFT bandwidth for gapless CISPR band coverage....

26. Apr 2026Brownkeys SignalByThomas
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Why Modern Debugging Requires Both Protocol and Physical Layer Analysis?

Why Modern Debugging Requires Both Protocol and Physical Layer Analysis?

Most debugging tools show only part of the story.Oscilloscopes reveal signals.Protocol analyzers decode data.But real problems often exist between the two.

12. Apr 2026Brown keys
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Why Your Signal Problem Is Actually a Power Problem: The Physics Behind SI/PI Coupling

Why Your Signal Problem Is Actually a Power Problem: The Physics Behind SI/PI Coupling

Power noise does not stay in the power domain. It becomes timing uncertainty, which becomes bit errors. At Embedded World 2026, I watched Tektronix demonstrate why signal integrity and power...

18. Apr 2026Brown keys
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Rohde & Schwarz Wideband Modulated Load Pull: The Test That Deliberately Breaks Your Amplifier

Rohde & Schwarz Wideband Modulated Load Pull: The Test That Deliberately Breaks Your Amplifier

Load pull testing deliberately varies impedance away from the ideal operating point — until the amplifier's behavior is fully mapped. At the microwave show, R&S showed why wideband modulated load...

7. Mai 2026Brownkeys SignalByThomas
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Automotive Ethernet Is Entering the Most Critical Phase of Its Adoption — And Most Engineers Are Not Ready

Automotive Ethernet Is Entering the Most Critical Phase of Its Adoption — And Most Engineers Are Not Ready

At Embedded World 2026, I watched a live Automotive Ethernet eye diagram close in real time. Here's what that means for every team building ADAS and SDV systems — and...

14. Apr 2026Brown keys
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Adaptive Gate Current Shaping: How Bosch EG120 Solves the Parallel SiC-MOSFET Balancing Problem

Adaptive Gate Current Shaping: How Bosch EG120 Solves the Parallel SiC-MOSFET Balancing Problem

Two SiC MOSFETs in parallel will never have exactly the same threshold voltage. That nanosecond difference creates transient current imbalance that degrades reliability over a vehicle's lifetime. The Bosch EG120...

27. Apr 2026Brownkeys SignalByThomas
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SiC MOSFET Power Characterization at PCIM: Why Static and Dynamic Are Two Different Worlds

SiC MOSFET Power Characterization at PCIM: Why Static and Dynamic Are Two Different Worlds

Two stations. Two measurement worlds. Tektronix and Keithley showed at PCIM why static DC characterization and dynamic switching power testing are not the same thing — and why SiC MOSFET...

30. Apr 2026Brownkeys SignalByThomas
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DC to 40 GHz in Real Time: What the TDEMI ULTRA Is Actually Claiming

DC to 40 GHz in Real Time: What the TDEMI ULTRA Is Actually Claiming

A table lamp as the device under test. A spectrum from DC to 40 GHz captured in real time. The Gauss Instruments TDEMI ULTRA Series isn't modest about what it...

23. Apr 2026Brownkeys SignalByThomas
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High-Speed Interconnect Testing: Why Signal Integrity Is Critical for Modern AI and Data Systems

High-Speed Interconnect Testing: Why Signal Integrity Is Critical for Modern AI and Data Systems

At high data rates, interconnects are no longer passive connections.PCB traces, connectors, and cables behave as complex analog systems.Signal integrity is becoming a critical factor in modern AI and high-speed...

13. Apr 2026Brown keys
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High-Speed Interface Testing for DDR and USB: When Digital Signals Become Analog

High-Speed Interface Testing for DDR and USB: When Digital Signals Become Analog

At DDR5 speeds, one bit lasts 156 picoseconds. At this scale, there is no digital — only analog behavior. At Embedded World 2026, I watched what it takes to keep...

16. Apr 2026Brown keys
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Virginia Diodes 300 GHz Dual Polarization OTA Link at EuMW 2025: 63 Gbps Over the Air — and What the Demo Doesn't Show You

Virginia Diodes 300 GHz Dual Polarization OTA Link at EuMW 2025: 63 Gbps Over the Air — and What the Demo Doesn't Show You

285 GHz. 12.5 GHz bandwidth. Dual polarization H+V. 63 Gbps. Live OFDM error summary on a Keysight UXR real-time oscilloscope. The Virginia Diodes demo at EuMW 2025 was the most...

8. Mai 2026Brownkeys SignalByThomas
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Using a Function Generator as a Delay Generator: Solving the Fixed 250 ns Trigger Offset Problem

Using a Function Generator as a Delay Generator: Solving the Fixed 250 ns Trigger Offset Problem

Fixed 250 ns trigger delay. Can't adjust it. Customer needs 10–100 ns range. Sound familiar? Here's why external trigger routing gives you a floor you can't go below — and...

14. Mai 2026Brownkeys SignalByThomas
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