Suchergebnisse
SiC MOSFET Power Characterization at PCIM: Why Static and Dynamic Are Two Different Worlds
Two stations. Two measurement worlds. Tektronix and Keithley showed at PCIM why static DC characterization and dynamic switching power testing are not the same thing — and why SiC MOSFET...
Tektronix vs. Keysight at PCIM: Two Ways to Look Inside a SiC MOSFET
Two booths at PCIM. Two oscilloscope giants. Both measuring SiC MOSFETs — but asking entirely different questions. This is what the Tektronix/Keithley vs. Keysight split reveals about where SiC technology...
No Bulk Capacitor, No Problem: Inside TI's Single-Stage Micro Inverter Demo at PCIM
A single-stage AC/DC micro inverter eliminates the intermediate 400V bus capacitors that limit the service life of conventional two-stage designs. The TI TIDM-01035ME2 at PCIM showed what that looks like...
- DesignValidation
- GaN
- HighSideMeasurement
- Keysight
- Oscilloscope
- PCIM2025
- PowerElectronics
- SiC
- SignalIntegrity
Two Oscilloscopes, One Wolfspeed Board: How Keysight Tackles the High-Side Measurement Problem at PCIM
One Wolfspeed SiC evaluation board. Two Keysight oscilloscopes — 1 GHz 14-bit on the left, 6 GHz 16-bit on the right. Same DUT, different measurement questions, different instrument tiers. The...
Power Integrity at PCIM: What OMICRON Lab and Picotest Were Really Asking
"Is your test bench complete?" That was the question on the wall at the OMICRON Lab and Picotest booth at PCIM. Four live demos — loop gain, output impedance, PSRR,...
- AutomatedTesting
- DoublePulseTest
- GateDriver
- Oscilloscope
- PCIM2025
- PowerElectronics
- RohdeSchwarz
- SiC
- Wolfspeed
Double Pulse Testing, Three Ways: From Manual Bench to Automated Production Cell at PCIM
The double pulse test is the same. The infrastructure around it has split into three distinct product categories: precision bench characterization (R&S MXO5), automated production testing (iPE cell), and development...
Wolfspeed Gen 4 SiC MOSFET at PCIM: 30–50% Less Turn-On Loss — But What Are You Actually Measuring?
Gen 4 delivers 30–50% lower turn-on switching losses. That's the claim. At PCIM, Wolfspeed backed it with a live oscilloscope comparison — three devices, same loop, same conditions. Here's what...
- AutomotivePower
- Bosch
- EVPowerTrain
- GateDriver
- PCIM2025
- PowerElectronics
- SiC
- SignalIntegrity
- TractionInverter
Adaptive Gate Current Shaping: How Bosch EG120 Solves the Parallel SiC-MOSFET Balancing Problem
Two SiC MOSFETs in parallel will never have exactly the same threshold voltage. That nanosecond difference creates transient current imbalance that degrades reliability over a vehicle's lifetime. The Bosch EG120...
- DoublePulseTest
- GaN
- GateDriver
- HighSideMeasurement
- IsolatedOscilloscope
- PCIM2025
- PowerElectronics
- SiC
- SignalIntegrity
The World's Only Fibre Optic Isolated Oscilloscope: Why Cleverscope CS548 Exists and What It Solves
How do you measure the high-side gate voltage in a GaN inverter when the switching node swings at 100 V/ns? The Cleverscope CS548 uses fibre optic isolation — 2kV between...
- Bosch EG120
- Gate Driver
- Gate Shaping
- Oscilloscope
- Parallel Switching
- PCIM 2025
- Power Electronics
- SiC MOSFET
- Tektronix DPO4034B
Intelligentes Schalten in SiC: Wie der Gate-Treiber EG120 von Bosch Oszilloskop-Feedback zur Synchronisierung von Leistungsbauelementen nutzt
Diese praktische Demo von Bosch zeigt, wie adaptive Gate-Stromformung und Echtzeit-Oszilloskop-Feedback eine der größten Herausforderungen bei der parallelen SiC-MOSFET-Schaltung lösen können.