Suchergebnisse
Why Measuring GaN Switching Is Harder Than Designing It
At high dv/dt and di/dt, measuring GaN switching behavior becomes more challenging than designing it. This article breaks down a complete probe-based measurement system observed at Embedded World 2026.
SiC MOSFET Power Characterization at PCIM: Why Static and Dynamic Are Two Different Worlds
Two stations. Two measurement worlds. Tektronix and Keithley showed at PCIM why static DC characterization and dynamic switching power testing are not the same thing — and why SiC MOSFET...
Tektronix vs. Keysight at PCIM: Two Ways to Look Inside a SiC MOSFET
Two booths at PCIM. Two oscilloscope giants. Both measuring SiC MOSFETs — but asking entirely different questions. This is what the Tektronix/Keithley vs. Keysight split reveals about where SiC technology...
- AutomotivePower
- Bosch
- EVPowerTrain
- GateDriver
- PCIM2025
- PowerElectronics
- SiC
- SignalIntegrity
- TractionInverter
Adaptive Gate Current Shaping: How Bosch EG120 Solves the Parallel SiC-MOSFET Balancing Problem
Two SiC MOSFETs in parallel will never have exactly the same threshold voltage. That nanosecond difference creates transient current imbalance that degrades reliability over a vehicle's lifetime. The Bosch EG120...
- Bosch EG120
- Gate Driver
- Gate Shaping
- Oscilloscope
- Parallel Switching
- PCIM 2025
- Power Electronics
- SiC MOSFET
- Tektronix DPO4034B
Intelligentes Schalten in SiC: Wie der Gate-Treiber EG120 von Bosch Oszilloskop-Feedback zur Synchronisierung von Leistungsbauelementen nutzt
Diese praktische Demo von Bosch zeigt, wie adaptive Gate-Stromformung und Echtzeit-Oszilloskop-Feedback eine der größten Herausforderungen bei der parallelen SiC-MOSFET-Schaltung lösen können.
Wolfspeed Gen 4 SiC MOSFET at PCIM: 30–50% Less Turn-On Loss — But What Are You Actually Measuring?
Gen 4 delivers 30–50% lower turn-on switching losses. That's the claim. At PCIM, Wolfspeed backed it with a live oscilloscope comparison — three devices, same loop, same conditions. Here's what...
MACOM and NI at the Microwave Show: From 250W GaN to 140 GHz SDR — What a "Complete System" Actually Looks Like
Two booths, 40 meters apart. MACOM with 250W GaN and 60 dBm limiters. NI with a live 140 GHz SDR link across 40 cm of free space. Neither was showing...
- DesignValidation
- GaN
- HighSideMeasurement
- Keysight
- Oscilloscope
- PCIM2025
- PowerElectronics
- SiC
- SignalIntegrity
Two Oscilloscopes, One Wolfspeed Board: How Keysight Tackles the High-Side Measurement Problem at PCIM
One Wolfspeed SiC evaluation board. Two Keysight oscilloscopes — 1 GHz 14-bit on the left, 6 GHz 16-bit on the right. Same DUT, different measurement questions, different instrument tiers. The...
- DoublePulseTest
- GaN
- GateDriver
- HighSideMeasurement
- IsolatedOscilloscope
- PCIM2025
- PowerElectronics
- SiC
- SignalIntegrity
The World's Only Fibre Optic Isolated Oscilloscope: Why Cleverscope CS548 Exists and What It Solves
How do you measure the high-side gate voltage in a GaN inverter when the switching node swings at 100 V/ns? The Cleverscope CS548 uses fibre optic isolation — 2kV between...
- AutomatedTesting
- DoublePulseTest
- GateDriver
- Oscilloscope
- PCIM2025
- PowerElectronics
- RohdeSchwarz
- SiC
- Wolfspeed
Double Pulse Testing, Three Ways: From Manual Bench to Automated Production Cell at PCIM
The double pulse test is the same. The infrastructure around it has split into three distinct product categories: precision bench characterization (R&S MXO5), automated production testing (iPE cell), and development...
- Embedded World 2026
- High Voltage Measurement
- Motor Drive Testing
- Oscilloscope
- Power Electronics
- Signal Integrity
Isolated Oscilloscopes: Why They Are Critical for Power Electronics Measurement
Modern power electronics systems challenge traditional oscilloscope design. Shared-ground measurements introduce errors and risks in high-voltage environments. Isolated architectures provide a fundamentally different approach to accurate measurement.
No Bulk Capacitor, No Problem: Inside TI's Single-Stage Micro Inverter Demo at PCIM
A single-stage AC/DC micro inverter eliminates the intermediate 400V bus capacitors that limit the service life of conventional two-stage designs. The TI TIDM-01035ME2 at PCIM showed what that looks like...
What Are You Missing with an 8-Bit Oscilloscope? A Closer Look at the UNI-T MSO5000HD
More bits alone do not make a better oscilloscope. What matters is whether higher resolution, low noise, deep memory and fast acquisition help you see something your existing instrument may...
Microsoft Rallies, Chips Fall: The AI Infrastructure Divide After the US Midterms
Microsoft rallied as chip stocks fell after the US midterms. An engineering view of the divide: data-center permits, power delivery, financing and the gap between planned capacity and paying customers.
Observations on the Future of Test & Measurement and Embedded Systems--Embedded World 2026
Embedded World 2026 revealed a major shift in the embedded industry: systems are rapidly evolving from traditional control electronics into intelligent edge computing platforms. From the rise of Edge AI...
10 Real Technology Trends in Test & Measurement
Embedded World 2026 once again demonstrated how quickly the embedded industry is evolving. Walking through the exhibition halls this year, one could clearly see that embedded systems are no longer...